Philippe, Anne, Nantes Universit ́e, CNRS, Laboratoire de Math ́ematiques Jean Leray, LMJL, F-44000 Nantes, France
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Vol 14, No 2 (2021): Electronic Journal of Applied Statistical Analysis - Original Paper
Detection of outliers with a Bayesian hierarchical model: application to the single-grain luminescence dating method.
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e-ISSN: 2070-5948