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Growth and properties of InN/Al2O3 and InN/GaN/Al2O3 studied by in situ Spectroscopic Ellipsometry and different ex situ techniques
M. Drago
,
U. W. Pohl
,
T. Schmidtling
,
W. Richter
DOI Code: 10.1285/i9788883050088p347
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کاغذ a4
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